中古 ZEISS EVO 40 #293757927 を販売中

Scanning Electron Microscope (SEM) Turbomolecular pump and Chamber High Vacuum (HV) and Extended Variable Pressure (XVP) Electron source: Tungsten cathode Resolution: 3.0 nm at 30 kV Magnifications: 7 - 1,000,000 times Sample chamber: 310 mm (Ø) x 220 mm Image resolution: up to 3072 x 2304 pixels Accelerating voltage: 0.2 - 30 kV Detectors: Everhart-Thornley SED (4) Quadrant back scatter detectors Variable Pressure Secondary Electron Detector (VPSE) Sample stage: X: 80 mm Y: 80 mm Z: 35 mm R: 360° Tilt: 0°-90° PC, 24" Operating system: Windows 7.