中古 JEOL JSM 6340F #9003281 を販売中

SEM Specifications:   a. Performance SEI Resolution : 1.2 nm guaranteed (Acc. V. = 15kV) 2.5 nm guaranteed (Acc. V. = 1kV) Magnification : x 25 (WD 25 mm) to x 650,000 Accelerating Voltage : 0.5 to 2.9 kV (10 V steps) 2.9 to 30 kV (100 V steps) Probe Current : 2 x 10-9 to 10-13 A Image Mode : SEI, LEI   b. Electron Optical System Electron Gun : High-resolution Conical Anode Field Emission Gun with Cold Cathode Alignment : Mechanical and Electromagnetic Deflection Condenser lens (C.L.) : Electromagnetic 2-stage zoom lens Objective lens (O.L.) : Superconical CF (corrected field) lens O.L. Apertures : Variable, 4-step click-stop type   c. Specimen Stage Type : Fully Eccentric Goniometer Movement :  X = 50mm, Y = 70mm, Z = 23mm Tilt = -5* to +45* Rotation = 360* endless (motor driven) Motorized movement for all 5 axes   d. Specimen Chamber Max Specimen size : 100mm or 4inch diameter Specimen Exchange: Airlock type (100mm dia. or less) EDS Detector : WD = 15 mm Take-off Angle = 20*   e. Display System Display Tubes Observation: One, 17-inch color CRT Recording : One, 5-inch ultra high resolution short-persistence CRT Scanning Modes : PIC (Full, ½ & ¼ frame), Bright-up, line Profile, Spot Display Modes : NORM, WFM, D-MAG, YZ Mod, FREZ, DUAL Display, Different magnification Images Auto Functions : Auto Focus, Auto Astigmatism Correction, Auto Contrast & Brightness Image Memory : 1280 x 1024 x 8 bits.