中古 HITACHI SU-8220 #293765956 を販売中

Scanning Electron Microscope (SEM) EDS Sample chamber: width 50 mm (Inner diameter) 5-axis electric center sample stage Electric Z-axis movable range 1.5 - 30 mm Spectrometer element analysis range: Be~Am SDD Detector Resolution: 127 eV (mn Ka) Technical indicators: Accelerating voltage: 100 V to 30 kV Landing energy range: 10eV to 30 KeV Magnification: 20x ~ 1000000x ESEM state: 10 to 500Pa Electron beam current range: 1 pa to 50 nA Sample chamber vacuum: High vacuum state: 10-6 Pa ~ 10-8 Pa Low vacuum and ESEM state: 10 ~ 500 Pa Resolution: High vacuum: 15 kV (BD): 0.5 nm 15 kV (6.4 nA, WD 10 mm): 1.9 nm 1 kV (BD): 0.8 nm 1 kV: 0.9 nm Low vacuum: 3 kV (30 Pa): 1.8 nm 15 kV (30 Pa): 1.2 nm.