中古 HITACHI S-3400N Type II #293799289 を販売中

Scanning Electron Microscope (SEM) Magnification range: 5x to 300000x Resolution: Type: SED Size: 3.0 nm Power supply: 30 kV Type: BSED Size: 4.0 nm Variable pressure Power supply: 30 kV Chamber and stage: Specimen size: up to 200 mm X Traverse: 80 mm (Type I), 100 mm (Type II) Y Traverse: 40 mm (Type I), 50 mm (Type II) Z Traverse: 5 to 35 mm (Type I), 5 to 65 mm (Type II) Rotation: 360° Tilt range: -20° to +90° Sample height: 40 mm (Type I), 85 mm (Type II) Manual motorization 5-Axis Detectors: SE Detector: everhart-thornley BSE Detector: five-segment solid-state Electron source: pre-centered tungsten hairpin Accelerating voltage: 300 V to 30 kV Vacuum system: Turbomolecular pump: 210 liter/sec Rotary pump: 162 l/min Variable pressure range: 6-270 Pa Chamber pump down time: ~90 Seconds Automatic functions: Brightness/Contrast Control (ABCC) Focus Control (AFC) Stigmator and Focus control (ASF) Filament Saturation (AFS) Beam Alignment (ABA) Beam Setting (ABS) Objective Aperture Alignment (AAA) Auto beam blanking Display and imaging: LCD Monitor, 19" Signal mixing (BSE, SE, ESED) Display mode: Standard, Full screen, Real-Time dual image Scan mode: TV Rate, Fast scan, Slow scan, Photo scan, Reduced area scan Image saving and processing: Pixel resolutions: 640 x 480 mm, 1280 x 960 mm, 2560 x 1920 mm, 5120 x 3840 mm Frame integration: 2 to 1024 Pseudo color Digital zoom Contrast/brightness Cropping Resizing Gamma control Edge enhancement Measurement and annotation: Text Graphics Data edger 3D Birds-eye view Operator assist: Stage memory (Type II): up to 200 positions Image navigator 3D Maintenance videos Magnification presets Power: Auto transformer: 100–220 V, Single phase, 2 kVA Rapid start: 6 min Anti-vibration system.