中古 ADVANTEST T 5371 #162879 を販売中

Memory test system Docking with TEL P-12XLn wafer prober Configuration: /DIAG/G SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1. 480DR+320I/O(HALF) 2. 768DR+512I/O(FULL) 3. 960DR+640I/O(FULL) 4. 240DR+160I/O(QUARTER) [1-4] ...> 3 NUMBER OF TEST HEAD [1,2] ...........................> 2 CONFIGURATION OF TEST HEAD 1 PE BOARD TYPE 0.NO BOARD 1.BGM-023206X04 (DR+IO PE,x2 AMP) 2.BGM-023206X05 (DR PE,x2 AMP) PIN 1 13 25 CHILD A1 ....> 1 1 1 CHILD A3 ....> 1 1 1 CHILD B1 ....> 1 1 1 CHILD B3 ....> 1 1 1 CHILD C1 ....> 1 1 1 CHILD C3 ....> 1 1 1 CHILD D1 ....> 1 1 1 CHILD D3 ....> 1 1 1 CHILD E1 ....> 1 1 1 CHILD E3 ....> 1 1 1 CHILD F1 ....> 1 1 1 CHILD F3 ....> 1 1 1 CHILD G1 ....> 1 1 1 CHILD G3 ....> 1 1 1 CHILD H1 ....> 1 1 1 CHILD H3 ....> 1 1 1 CONFIGURATION OF TEST HEAD 2 PE BOARD TYPE 0.NO BOARD 1.BGM-023206X04 (DR+IO PE,x2 AMP) 2.BGM-023206X05 (DR PE,x2 AMP) PIN 1 13 25 CHILD A1 ....> 1 1 1 CHILD A3 ....> 1 1 1 CHILD B1 ....> 1 1 1 CHILD B3 ....> 1 1 1 CHILD C1 ....> 1 1 1 CHILD C3 ....> 1 1 1 CHILD D1 ....> 1 1 1 CHILD D3 ....> 1 1 1 CHILD E1 ....> 1 1 1 CHILD E3 ....> 1 1 1 CHILD F1 ....> 1 1 1 CHILD F3 ....> 1 1 1 CHILD G1 ....> 1 1 1 CHILD G3 ....> 1 1 1 CHILD H1 ....> 1 1 1 CHILD H3 ....> 1 1 1 CONFIGURATION OF DPU 1'ST DPU : STN 1,2 [Y,N] ..........................> YES TEST HEAD 1 DC CONFIGURATION [1-32] .............> 1-32 PPS CONFIGURATION [1-128] ............> 1-128 TEST HEAD 2 DC CONFIGURATION [1-32] .............> 1-32 PPS CONFIGURATION [1-128] ............> 1-128 AC FREQUENCY (Hz) [50,60] ........................> 60 CONFIGURATION OF FTU FLASH OPTION [Y,N] ...........................> YES CONFIGURATION OF FM TYPE OF FM [1:NORMAL(AFM), 2:MRA4(FMRA)] ............> 2 NUMBER OF FMRA BOARD [0-8] ...........................> 8 SIZE OF FMRA BOARD [0,0G, 1:1G, 2:4G] ..............> 1 PM(PATTERN MEMORY) BOARD EXIST [Y,N] .................> YES SIZE OF PM BOARD [1:576M] ..........................> 1 END SAVE = = = = = = /LOG OD FF.