中古 PVA TEPLA / TECHNICS SAM 300 #9039862 を販売中

Scanning acoustic microscope (SAM), 6" Up to 8" capable Scanning range: 250 um X, 250 um Y, 100 mm Z System RF bandwidth: 500 MHz (2) 150 MHz Transducers A-Scan: local time of flight information B-Scan: analysis mode for virtual cross-sections C-Scan: imaging of selected gated echos X-Scan: precision gating of echoes with selectable step sizes for narrow layer by layer sample depth analysis D-Scan: virtual cross-section scans from sample top to bottom P-Scan: array of B-scans, free selectable Auto-Scan: automatically selection to pre-programmed location(s), selects field of view, magnification, auto focus, auto selections of gate parameters and gains for virtually automatic inspection of the samples Sequence Scan: automated scan of pre-defined areas and gated image positions, including auto focus Z-Scan: tomography image acquisition with digital reconstruction for virtual volumetric viewing with 3D profiling & non-destructive cross sectioning, acquisition of the entire time of flight information for each x,y pixel Tray Scan: automated scan of pre-defined areas, including auto focus.