JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System | Rotary pump | Power supply.
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6490LV

    Details
    ID#:
    9123092
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | EDAX EDS | PC System with JSM-6490LV software | PC with Noran software | Mechanical Pump | Flanges | Cables | Replacement cartridges | (2) Chiller boxes | Noran cables | Interface box with cables | Differential pump water hose | Low vacuum pipe | Tractor unit | RP filters | LV Pinami gauge | LN2 sensor | | Resolution: | -High vacuum mode: 3.0 nm (30 kV) | -Low vacuum mode: 4.0 nm (30 kV) | Accelerating voltage: 0.3 to 30 kV | Magnification: 5x to 300,000x | Filament: pre-centered W hairpin filament with continuous auto bias | Objective lens: super conical | Objective lens apertures: click-stop type (3-stop variable); fine position controllable with X-Y directions | Maximum specimen size: 8" coverage, 12" specimen can be loaded | Specimen state: 5-axis computer controller eucentric goniometer; X 125 mm, Y 100 mm, Z 5 to 80 mm, T -10 to 90°, R 360° endless | Vacuum mode changeover: automatic (PC interface controlled) | | EDAX: | Model: PV77-57810-ME | Active area: 10 mm2 | Amplifier model: 204 B+ | Window type: super ultra-thin window (SUTW) | Resolution: <132 eV @ MnKa @ 1 Kcps | Insertion / retraction: manual.
  • JEOL: JSM T330A

    Details
    ID#:
    9086990
    Category:
    Scanning Electron M...
    Scanning electron microscope | Computer system not included.
  • JEOL: JSM 6400F

    Details
    ID#:
    9089825
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6380

    Details
    ID#:
    9086904
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM-5800VP

    Details
    ID#:
    9096225
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Turbo pump | | Optional: | EDS | WDS.
  • JEOL: JSM 5200

    Details
    ID#:
    9082752
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6600FXV

    Details
    ID#:
    9098215
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Imaging and control system | Currently in storage.
  • JEOL: JSM 7400F

    Details
    ID#:
    9097820
    Category:
    Scanning Electron M...
    Field Emission Scanning Electron Microscope (FE-SEM).
  • JEOL: JSM 6335F

    Details
    ID#:
    9080017
    Category:
    Scanning Electron M...
    Field emission scanning electron microscope, (FESEM). |
  • JEOL: JSM 6400F

    Details
    ID#:
    9080576
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 5910LV

    Details
    ID#:
    9079276
    Category:
    Scanning Electron M...
    Vintage:
    2002 
    Scanning electron microscope (SEM) | High vacuum mode: resolution: 3.0nm LV cooling | Magnification: x18 ~ 300,000 | Image: secondary electron image and reflected electron image | Low vacuum mode: Resolution: 4.5nm | Image: backscattered electron image | Input: 1φ100V 50 / 60Hz 3KVA | Cooling water: 2L / min | 2002 vintage.
  • JEOL: JSM 6401

    Details
    ID#:
    9073237
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 5400

    Details
    ID#:
    9079563
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 5800LV

    Details
    ID#:
    9079565
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM 6300 V

    Details
    ID#:
    9098216
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Imaging and control system | Currently in storage.
  • JEOL: JSM 5410LV

    Details
    ID#:
    9080015
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
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