JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9040833
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | 1990 vintage.
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9070887
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Include a NORAN EDS system.
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM IC848A

    Details
    ID#:
    9039276
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) with EDS, 6" | | Includes: | Full element analysis capability | Large chamber design, 150 mm samples | Load lock | Full scanning in X and Y axis | Observation of 10 nm or less | Thermo Noran EDS detector (mounted) | No software or other hardware | | Accelerating voltage: | 0.2 to 40 kV (linked with bias, lens currents, and coil currents) | | Magnification: | 10x (at 39mm working distance) to 300,000x | 100x (fixed) | | Speciment movment rage: | X-direction: 160mm | Y-direction: 160mm | Z-direction: 38mm | Tilt : 0 to 60 degree | | Specimen exchange: | By airlock: Up to 204mm dia. specimen holders | By stage drawout: Available | | Speciment holder: | 12.5mm dia. x 10mm H specimens (height adjustable) | 102mm dia. x 0.5mm H specimens | 153mm dia. x 1mm H specimens | 204mm dia x 1mm H specimens.
  • JEOL: JSM 6300F

    Details
    ID#:
    53576
    Category:
    Scanning Electron M...
    FE SEM.
  • JEOL: JSM 820

    Details
    ID#:
    56370
    Category:
    Scanning Electron M...
    SEM, deinstalled.
  • JEOL: JSM 6340F

    Details
    ID#:
    9052725
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM 5610

    Details
    ID#:
    9008606
    Category:
    Scanning Electron M...
    Vintage:
    2002 
    Scanning electron microscope | Resolution (high vacuum mode): 3.5nm (3.5nm@Acc.volt30kv,WD6mm) | Accelerating voltage: x0.5 to 30kV (53 steps) | Images: SEI, BEI (COMPO, TOPO, Shadow) | Magnification: 18(18x@WD48)x to 300,000x (in 136 steps) | Specimen size: less than 6" | Specimen stage: | Eucentric goniometer | X: 80mm | Y: 40mm | Z: 5 to 48mm | Tilt: -10° to 90° | Rotation: 360° | Electron gun: W filament | Gun bias: automatically settable for all accelerating voltages | Image shift: +12 micrometer or -12 micrometer | Displayed image: 640 x 480 pixels(640×480, 1280×960pixels) | Analytical functions: OXFORD ISIS EDS system | Detectable element range: 5B to 92U | Backscatter | EDS | 2002 vintage.
  • JEOL: JSM 6335F

    Details
    ID#:
    9013667
    Category:
    Scanning Electron M...
    Field emission scanning electron microscope (FESEM) | 2002 vintage. |
  • JEOL: JSM 5600

    Details
    ID#:
    9052724
    Category:
    Scanning Electron M...
    CD SEM.
  • JEOL: JSM 6300F

    Details
    ID#:
    127276
    Category:
    Scanning Electron M...
    Field emission SEM | De-installed 2003 | Crated.
  • JEOL: JSM 6400F

    Details
    ID#:
    9059477
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Resolution: 1.5nm at 30 kV and 8 mm WD | Magnification: 10 x to 500000x | Probe current: 10 x 10^-12 to 10x10^-10A | Cold cathode field emission.
  • JEOL: JSM 5410 / MP 5410

    Details
    ID#:
    128977
    Category:
    Scanning Electron M...
    Scanning electron microscope | Voltage: 100V +/- 10V | Current maximum: 25A | Starting current maximum: 70A | Power maximum: 25 kVA | Frequency: 1 phase, 50 / 60 Hz | Ground resistance maximum: 100 ohm | Cooling water: 2 liters per minute.
  • JEOL: JSM 6400F

    Details
    ID#:
    126936
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6340F

    Details
    ID#:
    9013669
    Category:
    Scanning Electron M...
    Field emission scanning electron microscope (FESEM) | Oxford 7158 INCA Microanalysis system | JEOL stage controller | PC, monitor, HP Vectra Pentium 3 CPU | Windows NT 98 | HP Laser printer | Exela Cool Ace model CA-2500 cooling unit | Large chamber.
  • JEOL: JSM 5400

    Details
    ID#:
    9013668
    Category:
    Scanning Electron M...
    Scanning electron microscope | Noran Voyager EDS | Can be demonstrated | 1997 vintage.
  • JEOL: JSM IC848

    Details
    ID#:
    93872
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 7500

    Details
    ID#:
    9055561
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
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