JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9070887
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Include a NORAN EDS system.
  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System: included.
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM 5910LV

    Details
    ID#:
    9079276
    Category:
    Scanning Electron M...
    Vintage:
    2002 
    Scanning electron microscope (SEM) | High vacuum mode: resolution: 3.0nm LV cooling | Magnification: x18 ~ 300,000 | Image: secondary electron image and reflected electron image | Low vacuum mode: Resolution: 4.5nm | Image: backscattered electron image | Input: 1φ100V 50 / 60Hz 3KVA | Cooling water: 2L / min | 2002 vintage.
  • JEOL: JSM 840

    Details
    ID#:
    9063336
    Category:
    Scanning Electron M...
    Vintage:
    1989 
    Scanning electron microscope, (SEM) | Resolution 40nm WD 8mm, 35kV | Magnification 10X-300,000X | Eucentric large goniometer specimen stage X, Y, Z, tilt, rotation | Image modes: Secondary and Backscattered Electron | LaB6 electron source | Acceleration Voltage 0.2 - 40kV | Vacuum System: Rotary pump and oil diffusion | Power: 240/220/200/180 VAC, 6kVA, 50/60 Hz | | Digital Imaging: | JEOL Orion Imaging software and Win XP computer | Capable of documenting annotation and measurement | Image processing | Acquired image scan resolution: | 2560 x 2048 | 1280 x 1024 | 960 x 768 | 640 x 480 | | Cooling: | Water: 1 gallon/min | Temperature: 70 ±10°F | Pressure: 20 psi | | 1989 vintage.
  • JEOL: JSM-6330F

    Details
    ID#:
    9063091
    Category:
    Scanning Electron M...
    FE-SEM.
  • JEOL: JSM-5900LV

    Details
    ID#:
    9064221
    Category:
    Scanning Electron M...
    Vintage:
    2000 
    Variable pressure SEM, 6" | 6" wafer capable, can insert 6" sample | Specimen stage: fully automatic 5-axis 8" | Chamber for large specimens | Oxford EDS system | BSE detector | Resolution specifications: for the SE 3 nm at 30 kV; 5 nm at 30 kV for the BSE | Pressure: adjustable; 10 to 270 Pa, 3nm reso preferred | Specimen stage: X-movement: 125mm, Y-movement: 100mm, Z-movement: 43mm, Tilt: -10 to + 90º, Rotation: 360º | Specimen size: 8" diameter loadable, 7" diameter full coverage with rotation | Tungsten preferred but not mandatory | 2000 vintage.
  • JEOL: JSM 6400F

    Details
    ID#:
    9059477
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Resolution: 1.5 nm at 30 kV and 8 mm WD | Magnification: 10 x to 500000 x | Probe current: 10 x 10^-12 to 10 x 10^-10 A | Cold cathode field emission | | Diffusion pump and ion pump | Max pressure for imaging: 1 x 10e^-6 Torr.
  • JEOL: JSM 6360

    Details
    ID#:
    179578
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6600

    Details
    ID#:
    177690
    Category:
    Scanning Electron M...
    Scanning electron microscope | | Specifications: | Includes EDX option | 200VAC, 1 phase, 30A, 50/60Hz, 6KVA | Secondary electron image resolution (at 8mm working distance): at 35kV 3.5nm guaranteed and at 1kV 20.0nm attainable | Magnification: 10x to 300'000x | Accelerating voltage: 0.2 to 40kV (0.2 to 5kV variable in 0.1kV steps, 5 to 40kV variable in 1kV steps) | | 1990 vintage.
  • JEOL: JSM-6330F

    Details
    ID#:
    9071903
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6300F

    Details
    ID#:
    116159
    Category:
    Scanning Electron M...
    Vintage:
    1993 
    field emission SEM | Capability: up to 500,000x, 0.5 to 30kV | | Includes: | Console | Gun assembly | Mechanical pump | Bake unit. | EDX has been removed
  • JEOL: JSM T330A

    Details
    ID#:
    9069334
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Includes EDS.
  • JEOL: JSM 6700F + Alto Gatan 2500

    Details
    ID#:
    46262
    Category:
    Scanning Electron M...
    Wafer Size:
    8" 
    Vintage:
    2006 
    SEM, 8" | Comes with full accessories as well as an UNUSED Gatan Alto 2500 Cryo transfer system (2003 vintage) for wet samples | Decommissioned by OEM and stored in a clean temp controlled warehouse | Includes all specimen holders, high end HP computer hardware and many related software | The only requirement is a nitrogen source, either from bottled cylinder or produced by a N2 generator | 2006 vintage.
  • JEOL: JSM 6100

    Details
    ID#:
    43026
    Category:
    Scanning Electron M...
    Vintage:
    1995 
    SEM and Oxford Instruments | Secondary and backscattered electron detectors on SEM | 40 Angstrom image resolution at 8-mm | 10x - 300,000x magnification | 6 inch load-lock chamber door | 0.3-30 kV tungsten gun | Motorized 40 mm x 100 mm specimen stage movement; tilt; rotation | Image storage and retrieval system on SEM | | Oxford Instruments ISIS energy dispersive X-ray spectroscopy system: | Digital pulse processor | Windows 2000 PC-based | Digital image collection | Line scanning | Elemental dot mapping | | If turned too fast, magnification knob sometimes skips a setting | All magnifications achievable | | Configured with a pulse processed ISIS 300 box and an INCA detector | INCA detector reports NIST reference material within ±3% of their actual values per calibration history | | ISIS box: ~1997 vintage | SEM: 1995 vintage.
  • JEOL: JSM 6600F

    Details
    ID#:
    9035051
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM T330A

    Details
    ID#:
    116691
    Category:
    Scanning Electron M...
    Scanning Electron Microscope with Tracor Northern Z-Max 30 Series TN5502N EDS System | Resolution: 5nm (SEI, 30kV, WD=10nm) | Magnification: | LGS 15x (WD=48mm) -200,000x | SGZ 35x (WD=38mm)-200,000x | Accelerating voltage: 0.5-30Kv | Cooling water: 2L per minute | Power requirement: 100VAC 1Phase 50/60Hz, 2kVA | Constant Current: 20A, Starting Current: 60A | Tracor Northern Z-Max 30 Series TN-5502N EDS system specifications: | Z-Max 30 Series Model: 98-629I3/54S | Controller Model: TN-5502N Assy.:700P117748 | Laboratory Resolution: 148.6 | Laboratory Peak/BKGD.: 889 | Bias Voltage: -400V | Heater Voltage: 10.0 | Controller Power Requirement: 115VAC 12A or 230VAC 7A.
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