JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System: included.
  • JEOL: JSM 6400

    Details
    ID#:
    9070887
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Include a NORAN EDS system.
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM T330A

    Details
    ID#:
    116691
    Category:
    Scanning Electron M...
    Scanning Electron Microscope with Tracor Northern Z-Max 30 Series TN5502N EDS System | Resolution: 5nm (SEI, 30kV, WD=10nm) | Magnification: | LGS 15x (WD=48mm) -200,000x | SGZ 35x (WD=38mm)-200,000x | Accelerating voltage: 0.5-30Kv | Cooling water: 2L per minute | Power requirement: 100VAC 1Phase 50/60Hz, 2kVA | Constant Current: 20A, Starting Current: 60A | | Tracor Northern Z-Max 30 Series TN-5502N EDS system specifications: | Z-Max 30 Series Model: 98-629I3/54S | Controller Model: TN-5502N Assy.:700P117748 | Laboratory Resolution: 148.6 | Laboratory Peak/BKGD.: 889 | Bias Voltage: -400V | Heater Voltage: 10.0 | Controller Power Requirement: 115VAC 12A or 230VAC 7A.
  • JEOL: JSM 6340F

    Details
    ID#:
    9076781
    Category:
    Scanning Electron M...
    FE-Scanning electron microscope (SEM).
  • JEOL: JSM 5200

    Details
    ID#:
    9082752
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM-5800

    Details
    ID#:
    9021406
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | with Oxford 5431 EDS/EDAX unit | Backscatter option installed | PC not included | Non-operational.
  • JEOL: JSM 6700F + Alto Gatan 2500

    Details
    ID#:
    46262
    Category:
    Scanning Electron M...
    Wafer Size:
    8" 
    Vintage:
    2006 
    SEM, 8" | Comes with full accessories as well as an UNUSED Gatan Alto 2500 Cryo transfer system (2003 vintage) for wet samples | Decommissioned by OEM and stored in a clean temp controlled warehouse | Includes all specimen holders, high end HP computer hardware and many related software | The only requirement is a nitrogen source, either from bottled cylinder or produced by a N2 generator | 2006 vintage.
  • JEOL: JSM 6300V

    Details
    ID#:
    9016383
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM 6401

    Details
    ID#:
    9073237
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6300F

    Details
    ID#:
    116159
    Category:
    Scanning Electron M...
    Vintage:
    1993 
    field emission SEM | Capability: up to 500,000x, 0.5 to 30kV | | Includes: | Console | Gun assembly | Mechanical pump | Bake unit. | EDX has been removed
  • JEOL: JSM 5800LV

    Details
    ID#:
    9079565
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM 6300F

    Details
    ID#:
    53576
    Category:
    Scanning Electron M...
    FE SEM.
  • JEOL: JSM 6400F

    Details
    ID#:
    126936
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM T3000

    Details
    ID#:
    128993
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 840F

    Details
    ID#:
    9081172
    Category:
    Power Supplies
    Main power console.
  • JEOL: JSM 6100

    Details
    ID#:
    201085
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM) | 200 VAC, 15A, 1 phase, 50/60 Hz, 3 kVA.
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