JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System: included.
  • JEOL: JSM 6400

    Details
    ID#:
    9070887
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Include a NORAN EDS system.
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM 6400F

    Details
    ID#:
    9059477
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Resolution: 1.5 nm at 30 kV and 8 mm WD | Magnification: 10 x to 500000 x | Probe current: 10 x 10^-12 to 10 x 10^-10 A | Cold cathode field emission | | Diffusion pump and ion pump | Max pressure for imaging: 1 x 10e^-6 Torr.
  • JEOL: JSM 6100

    Details
    ID#:
    43026
    Category:
    Scanning Electron M...
    Vintage:
    1995 
    SEM and Oxford Instruments | Secondary and backscattered electron detectors on SEM | 40 Angstrom image resolution at 8-mm | 10x - 300,000x magnification | 6 inch load-lock chamber door | 0.3-30 kV tungsten gun | Motorized 40 mm x 100 mm specimen stage movement; tilt; rotation | Image storage and retrieval system on SEM | | Oxford Instruments ISIS energy dispersive X-ray spectroscopy system: | Digital pulse processor | Windows 2000 PC-based | Digital image collection | Line scanning | Elemental dot mapping | | If turned too fast, magnification knob sometimes skips a setting | All magnifications achievable | | Configured with a pulse processed ISIS 300 box and an INCA detector | INCA detector reports NIST reference material within ±3% of their actual values per calibration history | | ISIS box: ~1997 vintage | SEM: 1995 vintage.
  • JEOL: JSM 5400LV

    Details
    ID#:
    9079563
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6700F + Alto Gatan 2500

    Details
    ID#:
    46262
    Category:
    Scanning Electron M...
    Wafer Size:
    8" 
    Vintage:
    2006 
    SEM, 8" | Comes with full accessories as well as an UNUSED Gatan Alto 2500 Cryo transfer system (2003 vintage) for wet samples | Decommissioned by OEM and stored in a clean temp controlled warehouse | Includes all specimen holders, high end HP computer hardware and many related software | The only requirement is a nitrogen source, either from bottled cylinder or produced by a N2 generator | 2006 vintage.
  • JEOL: JSM 6340F

    Details
    ID#:
    9052725
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM 6600

    Details
    ID#:
    177690
    Category:
    Scanning Electron M...
    Scanning electron microscope | | Specifications: | Includes EDX option | 200VAC, 1 phase, 30A, 50/60Hz, 6KVA | Secondary electron image resolution (at 8mm working distance): at 35kV 3.5nm guaranteed and at 1kV 20.0nm attainable | Magnification: 10x to 300'000x | Accelerating voltage: 0.2 to 40kV (0.2 to 5kV variable in 0.1kV steps, 5 to 40kV variable in 1kV steps) | | 1990 vintage.
  • JEOL: JSM 5910LV

    Details
    ID#:
    9079276
    Category:
    Scanning Electron M...
    Vintage:
    2002 
    Scanning electron microscope (SEM) | 3.0nm LV cooling | 18 x ~300,000 magnification | 100V, 50/60 Hz, 3KVA | 2L/min Cooling water | 2002 vintage.
  • JEOL: JSM 7500

    Details
    ID#:
    9055561
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM-5900

    Details
    ID#:
    9062877
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM 6300F

    Details
    ID#:
    116159
    Category:
    Scanning Electron M...
    Vintage:
    1993 
    field emission SEM | Capability: up to 500,000x, 0.5 to 30kV | | Includes: | Console | Gun assembly | Mechanical pump | Bake unit. | EDX has been removed
  • JEOL: JSM T330A

    Details
    ID#:
    9069334
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Includes EDS.
  • JEOL: JSM 840A

    Details
    ID#:
    9070161
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM IC848

    Details
    ID#:
    93872
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 6401F

    Details
    ID#:
    9065984
    Category:
    Scanning Electron M...
    SEM/EDX | Includes vacuum pump and chiller unit.
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