JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System | Rotary pump | Power supply.
  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9171178
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Not included: OXFORD monoCL Luminescence system.
  • JEOL: JSM 7400F

    Details
    ID#:
    188813
    Category:
    Scanning Electron M...
    Field Emission Scanning Electron Microscope (FE-SEM) | OXFORD INCA EDS / EDX | Includes: | (2) Work desks | (1) Motor control box | (1) Dell CPU | (1) JEOL controller | (1) HEWLETT PACKARD Monitor | (1) COMPAQ Keyboard | (1) COMPAQ CPU | (1) JEOL Rotary Pump | (1) JEOL Model SMD-58040 Refrigerated Circulating System | Currently de-installed | Currently crated.
  • JEOL: JSM 6390

    Details
    ID#:
    9161624
    Category:
    Scanning Electron M...
    Vintage:
    2008 
    Scanning electron microscope (SEM) | Tungsten | SE Detector | Resolution: 3.0nm (30kV) | Accelerating voltage: 0.5 to 30kV | Maximum magnification: 300,000 x | Tungsten filament (W) | Objective lens: Super conical lens | Objective lens apertures: Three position, controllable in X/Y directions | Rotary pump | ATC Chiller 1.5kW | Diffusion pump (to be confirmed) | Software version : JEOL TR0114-020 Version 8.24 | Specimen stage: | 5 Axis cartesian stage | X= 80mm Y=40mm Z= 5mm R= 360° (endless) T= -10/90° | Computer controlled 3 axis motor drive | X Y R Motorized | T Z Manual | Display: 20" LCD | Currently warehoused | 2008 vintage.
  • JEOL: JSM 6490LV

    Details
    ID#:
    9123092
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | EDAX EDS | PC System with JSM-6490LV software | PC with Noran software | Mechanical Pump | Flanges | Cables | Replacement cartridges | (2) Chiller boxes | Noran cables | Interface box with cables | Differential pump water hose | Low vacuum pipe | Tractor unit | RP filters | LV Pinami gauge | LN2 sensor | | Resolution: | -High vacuum mode: 3.0 nm (30 kV) | -Low vacuum mode: 4.0 nm (30 kV) | Accelerating voltage: 0.3 to 30 kV | Magnification: 5x to 300,000x | Filament: pre-centered W hairpin filament with continuous auto bias | Objective lens: super conical | Objective lens apertures: click-stop type (3-stop variable); fine position controllable with X-Y directions | Maximum specimen size: 8" coverage, 12" specimen can be loaded | Specimen state: 5-axis computer controller eucentric goniometer; X 125 mm, Y 100 mm, Z 5 to 80 mm, T -10 to 90°, R 360° endless | Vacuum mode changeover: automatic (PC interface controlled) | | EDAX: | Model: PV77-57810-ME | Active area: 10 mm2 | Amplifier model: 204 B+ | Window type: super ultra-thin window (SUTW) | Resolution: <132 eV @ MnKa @ 1 Kcps | Insertion / retraction: manual.
  • JEOL: JSM 700D

    Details
    ID#:
    9103836
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 5600LV

    Details
    ID#:
    9105934
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 5900LV

    Details
    ID#:
    9103753
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 6320F

    Details
    ID#:
    136303
    Category:
    Scanning Electron M...
    FE Scanning Electron Microscope.
  • JEOL: JSM 5800LV

    Details
    ID#:
    9113618
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Variable-pressure | Turbo-pumped | Tungsten SEM | Magnification: 18X – 300KX | GW Infrared chamberscope | Temp range: -10° to +90° | 360° continuous rotation | | Resolution: | 5.5 nm in low-vacuum mode | 3.5 nm in high-vacuum mode | | Detectors: | Backscatter (With Compo, Topo, & Shadow modes) | Secondary Electron | | Accelerating Voltage: | 0.3 – 3 kV in 0.1 kV steps | 3 – 30 kV in 1 kV steps | | Probe Current: 10-12 to 10-6 A | Auto-beam (Auto gun align, auto saturation) | Auto- brightness & contrast | Auto-focus | Dynamic focus | Scan rotation | | Eucentric goniometer stage- | 125mm movement in X | 100mm movement in Y | 43mm movement in Z | | Computerized stage controls: linked to mag and focus | Specimen position display on LCD and computer screen | Right display upgraded to flat-panel LCD | Fully automatic turbo-pumped vacuum system: no chiller needed | | 110 Volts. |
  • JEOL: JSM 6600

    Details
    ID#:
    9107243
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 5500

    Details
    ID#:
    9103747
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 6390LV

    Details
    ID#:
    9103749
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 6600FXV

    Details
    ID#:
    9098215
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Imaging and control system | Currently in storage.
  • JEOL: JSM 6400F

    Details
    ID#:
    9089825
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400F

    Details
    ID#:
    9080576
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM-5800VP

    Details
    ID#:
    9096225
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Turbo pump | | Optional: | EDS | WDS.
  • JEOL: JSM 6300 V

    Details
    ID#:
    9098216
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Imaging and control system | Currently in storage.
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