JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System: included.
  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM 6340F

    Details
    ID#:
    9052725
    Category:
    Scanning Electron M...
    CD Scanning electron microscope, (CD-SEM).
  • JEOL: JSM 6300F

    Details
    ID#:
    53576
    Category:
    Scanning Electron M...
    FE SEM.
  • JEOL: JSM 5510

    Details
    ID#:
    9082949
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM 5600

    Details
    ID#:
    9052724
    Category:
    Scanning Electron M...
    CD SEM.
  • JEOL: JSM 5600LV

    Details
    ID#:
    9005306
    Category:
    Scanning Electron M...
    FE-SEM, with EDX and fine coater.
  • JEOL: JSM T330A

    Details
    ID#:
    9003668
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM-6330F

    Details
    ID#:
    9063091
    Category:
    Scanning Electron M...
    FE-SEM.
  • JEOL: JSM 840F

    Details
    ID#:
    9081172
    Category:
    Power Supplies
    Main power console.
  • JEOL: JSM 6340F

    Details
    ID#:
    9003281
    Category:
    Scanning Electron M...
    SEM | | Specifications:   | | a. Performance | SEI Resolution : 1.2 nm guaranteed (Acc. V. = 15kV) | 2.5 nm guaranteed (Acc. V. = 1kV) | Magnification : x 25 (WD 25 mm) to x 650,000 | Accelerating Voltage : 0.5 to 2.9 kV (10 V steps) | 2.9 to 30 kV (100 V steps) | Probe Current : 2 x 10-9 to 10-13 A | Image Mode : SEI, LEI |   | b. Electron Optical System | Electron Gun : High-resolution Conical Anode Field Emission Gun with Cold Cathode | Alignment : Mechanical and Electromagnetic Deflection | Condenser lens (C.L.) : Electromagnetic 2-stage zoom lens | Objective lens (O.L.) : Superconical CF (corrected field) lens | O.L. Apertures : Variable, 4-step click-stop type |   | c. Specimen Stage | Type : Fully Eccentric Goniometer | Movement :  X = 50mm, Y = 70mm, Z = 23mm | Tilt = -5* to +45* | Rotation = 360* endless (motor driven) | Motorized movement for all 5 axes |   | d. Specimen Chamber | Max Specimen size : 100mm or 4inch diameter | Specimen Exchange: Airlock type (100mm dia. or less) | EDS Detector : WD = 15 mm | Take-off Angle = 20* |   | e. Display System | Display Tubes | Observation: One, 17-inch color CRT | Recording : One, 5-inch ultra high resolution short-persistence CRT | Scanning Modes : PIC (Full, ½ & ¼ frame), Bright-up, line Profile, Spot | Display Modes : NORM, WFM, D-MAG, YZ Mod, FREZ, DUAL Display, Different magnification Images | Auto Functions : Auto Focus, Auto Astigmatism Correction, Auto Contrast & Brightness | Image Memory : 1280 x 1024 x 8 bits.
  • JEOL: JSM 6390LV

    Details
    ID#:
    9029909
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Resolution: High Vacuum mode: 3.0 nm(30kV). Low Vacuum mode: 4.0 nm(30kV) | Accelerating voltage: 0.5 to 30 kV | Magnification: x5 to 300,000 | Filament: Pre-centered W hairpin filament (with continuous auto bias) | Objective lens: Super conical lens | Objective lens apertures: Three position, controllable in X/Y directions | | Maximum specimen size: | GS Type stage: 32mm full coverage | LGS Type stage: 5" full coverage (152.4mm dia. loadable) | | Specimen stage: | GS Type stage: | Eucentric goniometer | X=20mm, Y=10mm, Z=5mm-48mm | R=360° (endless) | Tilt -10/+90° | | LGS Type stage Eucentric goniometer: | X=80mm, Y=40mm, Z=5mm-48mm | R=360° (endless) | Tilt -10/+90° | (Computer controlled 2, 3 or 5 axis motor drive: option) | | Display LCD: 20 inch, high resolution FPD | | 2010 vintage.
  • JEOL: JSM 6600FXV

    Details
    ID#:
    9098215
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Imaging and control system | Currently in storage.
  • JEOL: JSM T3000

    Details
    ID#:
    128993
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM-5800VP

    Details
    ID#:
    9096225
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM) | Turbo pump | | Optional: | EDS | WDS.
  • JEOL: JSM 6400F

    Details
    ID#:
    126936
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400F

    Details
    ID#:
    9089825
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
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