JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9184151
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Torr range: 10^-7 | Stage retrofitted with stepper motors | Motion control system | Diffusion pumped | With a cryo trap | Stock everhard-thornley detector | Backscatter detector | Not included: | NPGS system | Accessories: | Load-lock | Fast beam blanker | With a spare driver module | No EDS or WDS.
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System | Rotary pump | Power supply.
  • JEOL: JSM 6400

    Details
    ID#:
    9171178
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Not included: OXFORD monoCL Luminescence system.
  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6510

    Details
    ID#:
    9184193
    Category:
    Scanning Electron M...
    Vintage:
    2012 
    Scanning electron microscope (SEM) | Tungsten filament | Includes: | Standard recipe | Stigmator memory | Dual live image | Full size image display | Pseudo color | Digital zoom | Dual magnification | Measurement | Auto image archiving | JED-2300 EDS (JSM-6510LA and JSM-6510A) | Resolution HV mode: 3.0 nm (30 kV), 8nm (3 kV), 15 nm (1 kV) | LV Mode: 4.0 nm (30 kV) (JSM-6510LA and JSM-6510LV) | Magnification: × 5 to × 300,000 (on 128 mm × 96 mm image size) | Preset magnifications: (5) Steps | Custom recipe: | Operation conditions: | Optics | Image mode | LV Pressure | Image mode: | Secondary electron image | REF Image | Composition (JSM-6510LA and JSM-6510LV) | Topography (JSM-6510LA and JSM-6510LV) | Shadowed (JSM-6510LA and JSM-6510LV) | Accelerating voltage: 0.5 kV to 30 kV | Filament: Factory pre-centered filament | Electron gun: Automated, manual override | Condenser lens: Zoom condenser lens | Objective lens: Super conical objective lens | Objective lens apertures: (3) Stages, XY fine adjustable | Electrical image shift: ± 50 μm (WD = 10 mm) | Auto functions: Focus, brightness, contrast, stigmator | Eucentric large-specimen stage: | X: 80 mm | Y: 40 mm | Z: 5 mm to 48 mm | Tilt: −10° to 90° | Rotation: 360° | Reference image (navigator): (4) Images | Maximum specimen: 150 mm diameter | PC: IBM PC/AT Compatible | OS: Windows 7 | Monitor: 19" LCD | Frame store: 640 × 480, 1280 × 960, 2560 × 1920, 5120 × 3340 | Multi image display: | (2) Images | (4) Images | Network: Ethernet | Image format: BMP, TIFF, JPEG | Fully automated pumping system: | DP1(diffusion pump) | RP1(rough pump) | Switching vacuum mode: < 1 min | LV Pressure: 10 to 270 Pa | Options: | Backscattered electron detector (JSM-6510LA and JSM-6510A) | Low vacuum secondary electron detector | Energy dispersive X-ray analyzer (EDS) | Wave length dispersive X-ray analyzer (WDS) | EBSD | Stage navigation system | Airlock chamber | Chamber scope | Operation keyboard | LaB6 Electron gun | Report creation software: SMile View™ (JSM-6510LA and JSM-6510A) | Operation console: 750 mm wide, 900 mm wide | Motor controlled stage: | (2) Axes | (3) Axes | (5) Axes | 2012 vintage.
  • JEOL: JSM 6490LV

    Details
    ID#:
    9123092
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | EDAX EDS | PC System with JSM-6490LV software | PC with Noran software | Mechanical Pump | Flanges | Cables | Replacement cartridges | (2) Chiller boxes | Noran cables | Interface box with cables | Differential pump water hose | Low vacuum pipe | Tractor unit | RP filters | LV Pinami gauge | LN2 sensor | | Resolution: | -High vacuum mode: 3.0 nm (30 kV) | -Low vacuum mode: 4.0 nm (30 kV) | Accelerating voltage: 0.3 to 30 kV | Magnification: 5x to 300,000x | Filament: pre-centered W hairpin filament with continuous auto bias | Objective lens: super conical | Objective lens apertures: click-stop type (3-stop variable); fine position controllable with X-Y directions | Maximum specimen size: 8" coverage, 12" specimen can be loaded | Specimen state: 5-axis computer controller eucentric goniometer; X 125 mm, Y 100 mm, Z 5 to 80 mm, T -10 to 90°, R 360° endless | Vacuum mode changeover: automatic (PC interface controlled) | | EDAX: | Model: PV77-57810-ME | Active area: 10 mm2 | Amplifier model: 204 B+ | Window type: super ultra-thin window (SUTW) | Resolution: <132 eV @ MnKa @ 1 Kcps | Insertion / retraction: manual.
  • JEOL: JSM 6390LV

    Details
    ID#:
    9103749
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 5500

    Details
    ID#:
    9103747
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 5900LV

    Details
    ID#:
    9103753
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 700D

    Details
    ID#:
    9103836
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 7400F

    Details
    ID#:
    9109498
    Category:
    Scanning Electron M...
    Field Emission Scanning Electron Microscope (FE-SEM).
  • JEOL: JSM 6330F

    Details
    ID#:
    9109202
    Category:
    Scanning Electron M...
    Scanning electron microscope, (SEM).
  • JEOL: JSM 6600

    Details
    ID#:
    9107243
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 5600LV

    Details
    ID#:
    9105934
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 840A

    Details
    ID#:
    9102734
    Category:
    Scanning Electron M...
    Vintage:
    1983 
    Scanning electron microscope (SEM), 1983 vintage.
  • JEOL: JSM 840

    Details
    ID#:
    9102733
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 5200

    Details
    ID#:
    9082752
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400F

    Details
    ID#:
    9080576
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6335F

    Details
    ID#:
    9080017
    Category:
    Scanning Electron M...
    Field emission scanning electron microscope, (FESEM). |
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