JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9040833
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | 1990 vintage.
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9070887
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Include a NORAN EDS system.
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM 6600F

    Details
    ID#:
    196333
    Category:
    Scanning Electron M...
    Field emission microscope | Does not have EDS.
  • JEOL: JSM 6100

    Details
    ID#:
    201085
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM) | 200 VAC, 15A, 1 phase, 50/60 Hz, 3 kVA.
  • JEOL: JSM 6400F

    Details
    ID#:
    136301
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 5610

    Details
    ID#:
    142847
    Category:
    Scanning Electron M...
    Vintage:
    2002 
    Scanning electron microscope | Specifications: | Resolution (high vacuum mode): 3.5nm | Accelerating voltage: x0.5 to 30kV (53 steps) | Images: SEI, BEI (COMPO, TOPO, Shadow) | Magnification: 18x to 300,000x (in 136 steps) | Specimen size: less than 6" | Specimen stage: | Eucentric goniometer | X: 80mm | Y: 40mm | Z: 5 to 48mm | Tilt: -10° to 90° | Rotation: 360° | Electron gun: W filament | Gun bias: automatically settable for all accelerating voltages | Image shift: +12 micrometer or -12 micrometer | Displayed image: 640 x 480 pixels | Analytical functions: OXFORD ISIS EDS system | Detectable element range: 5B to 92U | Problem with (1) PCB on INCA 300 EDS | (2) Diodes need to be replaced | 2002 vintage.
  • JEOL: JSM 6320F

    Details
    ID#:
    136303
    Category:
    Scanning Electron M...
    FE Scanning Electron Microscope.
  • JEOL: JSM IC848

    Details
    ID#:
    144144
    Category:
    Scanning Electron M...
    Wafer Size:
    8" 
    Scanning electron microscope, 8" | Top down and oblique SEM imaging | 8" capable chamber | 4.5 nm resolution at 35 kV | ~60,000x | Digital image capture | Au sputter coating | Decommissioned in Q2 of 2009.
  • JEOL: JSM 6100

    Details
    ID#:
    200299
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | EDS Processor: Oxford Link ISIS Series 300 | EDS Computer: Hp Vectra XA | Operation system: Windows NT.
  • JEOL: JSM 6340F

    Details
    ID#:
    194643
    Category:
    Scanning Electron M...
    SEMs.
  • JEOL: JSM 6360A

    Details
    ID#:
    193172
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | EDX (pre-installed by OEM) | De-installed Q4 2012 | Currently warehoused | 2003 vintage.
  • JEOL: JSM 5600

    Details
    ID#:
    151009
    Category:
    Scanning Electron M...
    Analysis SEM.
  • JEOL: JSM 6360

    Details
    ID#:
    179578
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6600

    Details
    ID#:
    177690
    Category:
    Scanning Electron M...
    Scanning electron microscope | | Specifications: | Includes EDX option | 200VAC, 1 phase, 30A, 50/60Hz, 6KVA | Secondary electron image resolution (at 8mm working distance): at 35kV 3.5nm guaranteed and at 1kV 20.0nm attainable | Magnification: 10x to 300'000x | Accelerating voltage: 0.2 to 40kV (0.2 to 5kV variable in 0.1kV steps, 5 to 40kV variable in 1kV steps) | | 1990 vintage.
  • JEOL: JSM 5600

    Details
    ID#:
    9052724
    Category:
    Scanning Electron M...
    CD SEM.
  • JEOL: JSM 6320F

    Details
    ID#:
    147170
    Category:
    Scanning Electron M...
    SEM, not operational.
  • JEOL: JSM 6700F

    Details
    ID#:
    61580
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | High resolution with a cold field emission source | Use range: 0.5 - 30 kV with a resolution of 1.2nm at 15 kV and 2.5nm at 1 kV | A secondary electron detector is integrated into the bore of the lens and the specimen can be brought up into the lens field | Working distance: as low as 2mm | Second conventional secondary electron detector, which gives more topographic images | Magnifications of 25x to 650,000x (at 8mm working distance) | Digital imaging system is optional | EDX system is optional.
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