JEOL JSM 6400 Products

  • JEOL: JSM 6400

    Details
    ID#:
    9079566
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    133014
    Category:
    Scanning Electron M...
    F SEM, parts system | SEIKO SEIKI STP300 turbo pump. |
  • JEOL: JSM 6400

    Details
    ID#:
    9070887
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Include a NORAN EDS system.
  • JEOL: JSM 6400

    Details
    ID#:
    9064969
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM 6400

    Details
    ID#:
    9075095
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Gun ion pump version | PGT EDX System: included.
  • JEOL: JSM 6480LV

    Details
    ID#:
    9065026
    Category:
    Scanning Electron M...
    Scanning Electron Microscope | Includes EDS and WDS | LaB6/Tungsten | Fully automatic vacuum system | Resolution: 3.0nm | Super conical lens | Specimen exchange inter-lock | Magnification: Up to 300Kx | PC system with Oxford ED/WD software | PC system with JSM-6480LV software
  • JEOL: JSM 6010LA

    Details
    ID#:
    9080849
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | | Equipped with: | Energy Dispersive Spectroscopy (EDS) | Silicon Drift Detector (SDD) | onboard turbo pump | | Resolution High Vacuum mode: 4nm (20kV), 8nm (3kV), 15nm (1kV) | Low Vacuum mode: 5nm (20kV) BSE | Accelerating voltage 500V to 20kV | Magnification x5 to x300,000 (printed as a 128mm x 96mm micrograph) | LV detector Multi-segment BSED (std.) | LV-SED (option) | LV pressure 10 to 100 Pa | Maximum specimen size Observation£º125mm diameter | Loadable 152mm | LGS type stage Eucentric goniometer | X=80mm, Y=40mm, Z=5mm-48mm | R=360¡ã (endless) | Tilt -10/+90¡ã | (Computer-controlled 2 or 3-axis motor drive) | Frame Store Up to 5120¡Á3840 pixels | EDS Standard (LA Version) | Embedded EDS system (silicon drift detector technology) Includes: Spectral Mapping, Multi-Point Analysis, Automatic Drift Compensation | Joel JSM-6010LA Microscopes Main Controls | Table Top | Table Base/Power Box | Monitor | Computer | Cords and Cables | Misc Accessories and Parts | Voltage: 100 V | Frequency: 50/60 HERTZ | | InTouchScope function: | High resolution imaging in HV/LV/SE/BSE | Chemical analysis with integrated EDS built (standard on LA model) | Multi-touch screen control and wireless operation | Automatic SEM condition setup based on sample type | Simultaneous multiple live image and movie capture | Fast sample navigation at 5x ¨C 300,000x magnifications.
  • JEOL: JSM 6300V

    Details
    ID#:
    9016383
    Category:
    Scanning Electron M...
    SEM.
  • JEOL: JSM 6300F

    Details
    ID#:
    53576
    Category:
    Scanning Electron M...
    FE SEM.
  • JEOL: JSM 6400F

    Details
    ID#:
    9089825
    Category:
    Scanning Electron M...
    Scanning Electron Microscope (SEM).
  • JEOL: JSM T330A

    Details
    ID#:
    9003668
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 6400F

    Details
    ID#:
    9059477
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) | Resolution: 1.5 nm at 30 kV and 8 mm WD | Magnification: 10 x to 500000 x | Probe current: 10 x 10^-12 to 10 x 10^-10 A | Cold cathode field emission | | Diffusion pump and ion pump | Max pressure for imaging: 1 x 10e^-6 Torr.
  • JEOL: JSM 5410

    Details
    ID#:
    9003522
    Category:
    Scanning Electron M...
    Scanning electron microscope | Application for SEM, EDS, SemAfore, Sputter Coater | Currently installed in a lab.
  • JEOL: JSM 6330F

    Details
    ID#:
    9020243
    Category:
    Scanning Electron M...
    Cold Field Emission SEM | In-lens secondary electron detector with 2.5 nm resolution at 1 kV | 0.5 to 30kV operating voltage | Ultimate resolution: 1.5 nm | Magnification range: 10x – 400,000x | Maximum sample dimensions 50 x 125 x 125 mm | Oxford Instruments Energy Dispersive x-ray analysis system.
  • JEOL: JSM 6340F

    Details
    ID#:
    9003281
    Category:
    Scanning Electron M...
    SEM | | Specifications:   | | a. Performance | SEI Resolution : 1.2 nm guaranteed (Acc. V. = 15kV) | 2.5 nm guaranteed (Acc. V. = 1kV) | Magnification : x 25 (WD 25 mm) to x 650,000 | Accelerating Voltage : 0.5 to 2.9 kV (10 V steps) | 2.9 to 30 kV (100 V steps) | Probe Current : 2 x 10-9 to 10-13 A | Image Mode : SEI, LEI |   | b. Electron Optical System | Electron Gun : High-resolution Conical Anode Field Emission Gun with Cold Cathode | Alignment : Mechanical and Electromagnetic Deflection | Condenser lens (C.L.) : Electromagnetic 2-stage zoom lens | Objective lens (O.L.) : Superconical CF (corrected field) lens | O.L. Apertures : Variable, 4-step click-stop type |   | c. Specimen Stage | Type : Fully Eccentric Goniometer | Movement :  X = 50mm, Y = 70mm, Z = 23mm | Tilt = -5* to +45* | Rotation = 360* endless (motor driven) | Motorized movement for all 5 axes |   | d. Specimen Chamber | Max Specimen size : 100mm or 4inch diameter | Specimen Exchange: Airlock type (100mm dia. or less) | EDS Detector : WD = 15 mm | Take-off Angle = 20* |   | e. Display System | Display Tubes | Observation: One, 17-inch color CRT | Recording : One, 5-inch ultra high resolution short-persistence CRT | Scanning Modes : PIC (Full, ½ & ¼ frame), Bright-up, line Profile, Spot | Display Modes : NORM, WFM, D-MAG, YZ Mod, FREZ, DUAL Display, Different magnification Images | Auto Functions : Auto Focus, Auto Astigmatism Correction, Auto Contrast & Brightness | Image Memory : 1280 x 1024 x 8 bits.
  • JEOL: JSM 6400F

    Details
    ID#:
    126936
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
  • JEOL: JSM T3000

    Details
    ID#:
    128993
    Category:
    Scanning Electron M...
    Scanning electron microscope.
  • JEOL: JSM 5410 / MP 5410

    Details
    ID#:
    128977
    Category:
    Scanning Electron M...
    Scanning electron microscope | Voltage: 100V +/- 10V | Current maximum: 25A | Starting current maximum: 70A | Power maximum: 25 kVA | Frequency: 1 phase, 50 / 60 Hz | Ground resistance maximum: 100 ohm | Cooling water: 2 liters per minute.
  • JEOL: JSM IC848A

    Details
    ID#:
    9039276
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM) with EDS, 6" | | Includes: | Full element analysis capability | Large chamber design, 150 mm samples | Load lock | Full scanning in X and Y axis | Observation of 10 nm or less | Thermo Noran EDS detector (mounted) | No software or other hardware | | Accelerating voltage: | 0.2 to 40 kV (linked with bias, lens currents, and coil currents) | | Magnification: | 10x (at 39mm working distance) to 300,000x | 100x (fixed) | | Speciment movment rage: | X-direction: 160mm | Y-direction: 160mm | Z-direction: 38mm | Tilt : 0 to 60 degree | | Specimen exchange: | By airlock: Up to 204mm dia. specimen holders | By stage drawout: Available | | Speciment holder: | 12.5mm dia. x 10mm H specimens (height adjustable) | 102mm dia. x 0.5mm H specimens | 153mm dia. x 1mm H specimens | 204mm dia x 1mm H specimens.
  • JEOL: JSM 5400LV

    Details
    ID#:
    9079563
    Category:
    Scanning Electron M...
    Scanning electron microscope (SEM).
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